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Contribution Poster

Budker INP - 2nd and 3rd floors

Experimental modeling of the impulse diffraction system with a "white" SR beam.


  • Dr. Mihail FEDOTOV

Primary authors



Some matrix detectors (CCD and CIS) have direct X-ray sensitivity and can operate as dispersionless spectrometers with a very large number of elements (10E6 and more). In the case of the impulse diffraction such detector can simultaneously record a significant number of independent events. In the reading the position and energy of the absorbed X-ray photon may be restored for each event. The mathematical processing of the received data with respect to the Bragg condition can theoretically lead to the coordinates of the events of one fixed energy and to form an analogue of powder diffraction patterns. In this case the registration can be performed on the "white" SR beam for a short time (up to 1 ns or less).

The possibility of using of the 2000-element linear CCD ILX511 (Sony) as X-ray dispersionless spectrometer allowed to conduct simulation experiments to obtain diffraction patterns of graphite, boron nitride and TNT-hexogen solid detonation products. SR beam was modulated by a mechanical chopper and statistics were provided by a multiple recording with on-line processing.