Experimental realization of X-ray diffraction and small-angle scattering using polychromatic synchrotron radiation in the range 20-30 keV

5 Jul 2016, 15:00
1h
2nd and 3rd floors (Budker INP)

2nd and 3rd floors

Budker INP

Board: 036
Poster X-ray structural analysis Poster Session

Speaker

Prof. Boris Tolochko (Institute of solid state chemistry and mechanochemistry)

Description

The aim of this work is to develop a method to carry out X-ray analysis using a broad spectral of synchrotron radiation. This will give an opportunity to increase the number of photons in the primary beam on the order of 2-3 and thus reduce the exposure time for diffraction experiment to nanosecond at VEPP-3 and picosecond at VEPP-4.

Primary author

Prof. Boris Tolochko (Institute of solid state chemistry and mechanochemistry)

Co-authors

Mr Boris Pirogov (Institute of Solid State Chemistry and Mechanical, Novosibirsk) Dr Ivan Lvovich Zhogin (Open Joint Stock Company "Research and Production Enterprise ”Bourevestnik” (Bourevestnik, Inc.), Saint Petersburg, Russia) Mr Lev Shekhtman (Budker Institute of Nuclear Physics)

Presentation Materials

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