8-12 August 2016
Novosibirsk
Asia/Novosibirsk timezone

Heavy ion beam probe for measurements of plasma potential profile in GDT device

10 Aug 2016, 15:00
3h
Novosibirsk

Novosibirsk

Board: 61
Poster Plasma diagnostics Poster session

Speaker

Vadim Prikhodko (Budker Institute of Nuclear Physics)

Description

Spatial profile of electric potential is one of the principal plasma characteristics. However, potential have never been measured directly in high-temperature regimes of plasma in Gas-Dynamic Trap (GDT) device. Presented report is dedicated to the project of heavy ion beam probe (HIBP) for measurements of electric potential along plasma diameter at the midplane of GDT device. Beam of primary ions $Xe^{+1}$ is produced by 4-electrode accelerating system and has the following parameters: current up to 7 mA, ion energy of 60-70 keV, size of 4 mm and angular spread at the level of 1/e about 4 mrad. Secondary ions $Xe^{+2}$ are produced by primary beam ionization in plasma and enter the small aperture detector based on 30-degrees electrostatic energy analyzer. Each of the 8 detector channels provides electric potential measurement with accuracy of 10-50 V and spatial resolution of 2 cm at sampling rate of about 0.1 MHz.

Primary author

Vadim Prikhodko (Budker Institute of Nuclear Physics)

Co-authors

Dr Alexander Ivanov (Budker Institute of Nuclear Physics) Mr Anton Kolmogorov (Budker Institute of Nuclear Physics) Dr Vladimir Davydenko (Budker Institute of Nuclear Physics)

Presentation Materials

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Peer reviewing

Paper