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Contribution

X-ray spectroscopy

Current status of EXAFS station of SSTRC. Possibilities of XAFS method to investigate challenging functional nanomaterials. Reality and perspectives in future.

Speakers

  • Dr. Vladimir KRIVENTSOV

Primary authors

Content

At present time XAFS method, using of SR sources, in a various methodical modes and options is a well-known powerful tool to investigate the state of the elements and the local structure of the diverse nanosized systems having different kinds of aggregation: high dispersed material, semiconductors, solutions, nanoalloys, glasses and others. In this work, on example of studies carried out at the EXAFS station of SSTRC for a variety of nanosized systems used in materials science, catalysis, biology, the possibilities of XAFS spectroscopy are shown as an independent method and in combination with other physical methods of research, such as HRTEM, XRD, XPS, XRF. Possibilities of an integrated approach to study nanostructured systems having complex composition: ordered semiconductor nanostructures, nanocomposite catalysts, biological nanomaterials and others are demonstrated. Some conceptual aspects of new EXAFS beamline of Siberian Circular Photon Source (SKIF) are discussed. This work was supported by the Russian Foundation for Basic Research (projects No. 16-03-01139, 17-33-50198, 18-03-01251).