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SUMMARY:Regularization approach for specific adverse events in processing 
 elemental maps obtained using micro-XRF
DTSTART;VALUE=DATE-TIME:20200713T140700Z
DTEND;VALUE=DATE-TIME:20200713T140800Z
DTSTAMP;VALUE=DATE-TIME:20260419T143027Z
UID:indico-contribution-1874@indico.inp.nsk.su
DESCRIPTION:Speakers: Dmitry Sorokoletov ()\nMicro-XRF  is  a  promising  
 method  to  study  elemental  composition  of  samples  and  objects  of v
 arious  nature  with spatial  resolution  of tens  of microns  to tens  of
  nanometers  [1]. Application of  polycapillary  optics  for  focusing  an
 d  (optionally)  collecting  enables  conduction  of  studies on  synchrot
 ron  radiation  (SR)  sources  of  the  second  and  higher  generation\, 
  the  minimum possible  spatial  resolution  limited  to  values  of  10  
 to  25  microns  (effective  width  of  the  focus of X-ray lenses\, depen
 ding  on the  energy of transmitted  radiation)  [1].\n\nAt  a  sufficient
 ly  high  signal-to-noise  ratio  and  small  scanning  step\,  one  can  
 attain  subfocus resolution  (i.e.\,  its  further  reduction  by  a  fact
 or  of  2-3  [2])  via  processing  chemical  element distribution   maps 
  using  deconvolution  methods  [3].  However\,  at  operation  on  second
 generation  SR  sources\,  this  method  is  applicable  for  processing  
 maps  only  for  matrix  and minor  elements  (with relative  concentratio
 n  of not  less  than  one  percent)  [4].\n\nWe  have  developed  a  regu
 larization  approach  for  situations  with  signal  noise  of  medium gra
 de.  This  approach  correctly  takes  into  account  a  priori  specific 
  information  and  is  aimed  at identifying  the  most  general  properti
 es  of  composition  and  morphology  in  micro-areas  less than  15  micr
 ons  in  size.  It  was  tested  and  showed  a  good  result  for  two  c
 haracteristic  cases  of practical  importance\,  which  arose  in  proces
 sing  of  a    series  of  maps  resulting  from  studies  of geological  
 and cosmic  samples  (e.x.\, [4-5] and  so on) using micro-XRF.\n\nThe  wo
 rk  was  carried  out  in  the  framework  of  the  state  assignment  for
   Budker  INP  SB RAS  and the RFBR projects no. 19-05-50046\, 18-03-01251
 . The  work  was partly  done  at  the  shared  research  center SSTRC  on
   the  basis  of  the  Novosibirsk  FEL/VEPP-4-VEPP-2000  complex  at  BIN
 P  SB  RAS\, using  equipment  supported  by project  RFMEFI62119X0022.\n\
 n[1]   I.  Mantouvalou\, W.  Malzer  et  al.  Spectrochemica  Acta  Part  
 B. 77\, 2012\, 9-18 [2]  D.S. Sorokoletov\, Ya.V.  Rakshun\, E.P. Voytovic
 h  et  al. Physics  Procedia.  84\, 2016\, 295-301\n[3]  P. Wrobel\, M. Cz
 yzycki.   Talanta. 113\, 2013\, 62-67\n[4]  F.A.  Darin\,  Y.V.  Rakshun\,
  D.S. Sorokoletov  et  al.  Bulletin  of  the  Russian  Academy  of  Scien
 ces:  Physics.  83\, 2019\, 1433-1436\n[5]  F.  Darin\,  D.  Sorokoletov\,
   Ya.  Rakshun  et  el\,  Journal  of  surface  investigation:  x-ray\,  s
 ynchrotron  and  neutron techniques\, 12 (1)\,  2018\, 123-127\n\nhttps://
 indico.inp.nsk.su/event/24/contributions/1874/
LOCATION:
URL:https://indico.inp.nsk.su/event/24/contributions/1874/
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