BEGIN:VCALENDAR VERSION:2.0 PRODID:-//CERN//INDICO//EN BEGIN:VEVENT SUMMARY:X-ray reflecto-interferometer based on compound refractive lenses for thin-films study DTSTART;VALUE=DATE-TIME:20200713T134400Z DTEND;VALUE=DATE-TIME:20200713T134500Z DTSTAMP;VALUE=DATE-TIME:20260519T101554Z UID:indico-contribution-1878@indico.inp.nsk.su DESCRIPTION:Speakers: Maria Voevodina (Immanuel Kant Baltic Federal Univer sity)\nCompound refractive lenses (CRLs) have been widely used for more th an 20 years on leading synchrotrons and free-electron lasers for hard X-ra y beam transport\, collimation and focusing [1-2]. The combination of cohe rent compatible optics and new coherent sources increased opportunities fo r the development of new research methods.\nIn this abstract\, we demonstr ate a new X-ray interferometer based on compound refractive optics (CRL) f or thin-film structures study [3]. The idea of a reflecto-interferometer i s to use a very simplified experimental setup\, where a coherent monochrom atic X-ray beam\, focused by CRL\, impinges on a thin film at a grazing an gle. This converging fan of radiation incoming on a sample surface provide s a range of grazing angles. For each grazing angle\, the rays reflected f rom the front and rear boundaries of the film will interfere\, and as a re sult\, the diffracted intensity in the range of exit angles equal to the a ngular range of the incident fan will generate an interference pattern rep resenting fringes of equal inclination. The capabilities of the new reflec to-interferometer were demonstrated at the ESRF ID06 beamline using X-rays from 10 to 20 keV. The Si3N4 membranes of thicknesses in the range from 1 00 to 1000 nm were studied. Experimentally obtained reflecto-interferogram s correspond well with calculated ones\, and the distance between fringes correspond to the thickness of the tested membranes. While the interferenc e pattern in rather wide angular range is recorded in one shot\, the propo sed approach has a very good temporal resolution\, which is limited to a f ew milliseconds\, depending on the X-ray flux and the sensitivity of the d etector. The high spatial resolution of the interferometer was demonstrate d on interferograms recorded from an 8 nm-thick gold strip deposited on an Si3N4 membrane. It was shown that the interference pattern is very sensit ive even to small deviations in the thickness of the layer. \nIn addition\ , this reflecto-interferometer can be easily adapted for use with the Meta lJet Excillium micro-focus laboratory source\, which has GaKα emission li ne at 9.25 keV. As a result\, a series of interference patterns for test s ample - free-standing thin-film membrane thick of 500 um were observed.\nT he new X-ray reflecto-interferometer opens a wide range of opportunities f or the analysis of thin-film and multilayer systems. The recording of the interference pattern in a single shot allows a fast in-situ analysis of so lid and liquid materials including organic and biological films. The prop osed method has significant advantages compared to classical X-ray reflect ometry\, providing information on the thickness and density of layers or s tructures in real time which allows research with a fundamentally new spat ial and temporal resolution.\n\n1. A. Snigirev\, V. Kohn\, I. Snigireva et al. // Nature\, 384\, 49-51 (1996).\n2. Snigirev\, I. Snigireva // Spring er Series in Optical Sciences\, 137\, 255-285 (2008).\n3. Lyatun\, S.\, et al. Journal of synchrotron radiation 26.5 (2019).\n\nhttps://indico.inp.n sk.su/event/24/contributions/1878/ LOCATION: URL:https://indico.inp.nsk.su/event/24/contributions/1878/ END:VEVENT END:VCALENDAR