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SUMMARY:Characteristic of the BiTeCl electronic structure by resonant phot
 oemission
DTSTART;VALUE=DATE-TIME:20200713T142000Z
DTEND;VALUE=DATE-TIME:20200713T142100Z
DTSTAMP;VALUE=DATE-TIME:20260712T180017Z
UID:indico-contribution-1880@indico.inp.nsk.su
DESCRIPTION:Speakers: Yulia Khatchenko (M.N. Miheev Institute of Metal Phy
 sics of UB RAS\, 18 S. Kovalevskaya Str.\, Ekaterinburg\, 620108\, Russia)
 \nThe aim of this work is an experimental study of the electronic interact
 ion in the BiTeCl compound and its effect on the formation of the electron
 ic structure. The used method of resonant x-ray photoemission spectroscopy
  (RPES) allows distinguishing the contributions of the various components 
 to the valence bands. We can study not only the ground state\, but also th
 e characteristics of excited two-particle states\, the reaction to externa
 l action\, and the relaxation processes of the electronic system. \nBiTeCl
  has a hexagonal crystal structure of alternating layers of chlorine\, bis
 muth and tellurium atoms. The crystal has no inversion symmetry due to the
  continuous stacking order of the three atomic layers. The weak bonding be
 tween the Te and Cl layer provides a natural cleaving plane in the (0001) 
 plane. The BiTeCl crystal was grown based on BiCl3–Bi2Te3. The telluride
  compound was obtained by fusing stoichiometric amounts of elemental Bi an
 d Te at 600 ◦C. BiCl3 was prepared by the evaporation of a saturated sol
 ution of Bi2O3 in HCl acid. The charge was then sealed in a growth quartz 
 ampoule under a pressure of 10−3 Torr. After heating to 430 ◦C at a ra
 te of 20 ◦C h−1 followed by 1 day of soaking at this temperature the m
 elt was crystallized by a modified Bridgman method [1]. According to our x
 -ray diffraction analysis a major part of the aggregate consisted of the B
 iTeCl phase\, which was selected for the RPES measurements.\nThe experimen
 ts were carried out at the Russian–German laboratory of the BESSY II syn
 chrotron (Berlin). The RPES spectra were obtained using synchrotron radiat
 ion with 150–900 eV photon energy range. The energy resolution was 0.1 e
 V. The perfect working surface was prepared by cleaving the samples direct
 ly in the ultrahigh vacuum chamber of the spectrometer. The main regularit
 ies that appear when the excitation energy and the photoionization cross-s
 ection change were established.\n\n\n\nThe reported study was funded by RF
 BR\, project number 19-29-12061 and was carried out within the state assig
 nment of Ministry of Science and Higher Education of the Russian Federatio
 n (theme “Spin” No. АААА-А18-118020290104-2 and АААА-А19-119
 081990020-8).\n\nhttps://indico.inp.nsk.su/event/24/contributions/1880/
LOCATION:
URL:https://indico.inp.nsk.su/event/24/contributions/1880/
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