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SUMMARY:X-ray phase-sensitive imaging technique based on a bilens interfer
 ometer
DTSTART;VALUE=DATE-TIME:20200713T140800Z
DTEND;VALUE=DATE-TIME:20200713T140900Z
DTSTAMP;VALUE=DATE-TIME:20261008T192015Z
UID:indico-contribution-1882@indico.inp.nsk.su
DESCRIPTION:Speakers: Dmitry Zverev (Immanuel Kant Baltic Federal Universi
 ty)\nNowadays\, the continuous evolution of synchrotron radiation sources 
 has resulted in a dramatic increase of brilliance and degree of spatial co
 herence with respect to older designs. The availability of such intense co
 herent X-ray beams has triggered the development of wave splitting interfe
 rometers similar to the classical double-slit Young’s experiment [1-4]. 
 The bilens interferometer consisting of two parallel compound refractive l
 enses (CRL) and characterizing by high efficiency even in hard X-rays is a
  remarkable demonstration of such optical devices [5].\nIn this work\, the
  phase-sensitive X-ray imaging technique based on the bilens interferomete
 r is developed [6]. The essence of the method consists of scanning a sampl
 e\, which is set upstream of the bilens across the beam of one lens of the
  interferometer by recording changes in the interference pattern using a h
 igh-resolution image detector. The proposed approach allows acquiring the 
 absolute value of a phase shift profile of the sample with a fairly high p
 hase and spatial resolution. The possibilities of the imaging technique we
 re studied theoretically and experimentally using fibres with different si
 zes as the test samples at the ESRF ID06 beamline with 12 keV X-rays. The 
 corresponding phase shift profile reconstructions and computer simulations
  were performed. The experimental results are fully consistent with theore
 tical concepts and appropriate numerical calculations. Future improvements
  and applications of the interferometric imaging technique are discussed.\
 n\n[1]	Leitenberger\, W.\, Kuznetsov\, S. M.\, & Snigirev\, A. (2001). Int
 erferometric measurements with hard X-rays using a double slit. Optics com
 munications\, 191(1-2)\, 91-96.\n[2]	Lyubomirskiy\, M.\, Snigireva\, I.\, 
 & Snigirev\, A. (2016). Lens coupled tunable Young’s double pinhole syst
 em for hard X-ray spatial coherence characterization. Optics express\, 24(
 12)\, 13679-13686.\n[3]	Lyubomirskiy\, M.\, Snigireva\, I.\, Kuznetsov\, S
 .\, Yunkin\, V.\, & Snigirev\, A. (2015). Hard x-ray single crystal bi-mir
 ror. Optics letters\, 40(10)\, 2205-2208.\n[4]	Suzuki\, Y. (2004). Measure
 ment of x-ray coherence using two-beam interferometer with prism optics. R
 eview of scientific instruments\, 75(4)\, 1026-1029.\n[5]	Snigirev\, A.\, 
 Snigireva\, I.\, Kohn\, V.\, Yunkin\, V.\, Kuznetsov\, S.\, Grigoriev\, M.
  B.\, ... & Detlefs\, C. (2009). X-ray nanointerferometer based on si refr
 active bilenses. Physical review letters\, 103(6)\, 064801.\n[6]	Zverev D.
 \, Snigireva I.\, Kohn V.\, Kuznetsov S.\, Yunkin V.\, Snigirev A.\, (2020
 ) X-ray phase-sensitive imaging using a bilens interferometer based on ref
 ractive optics. Accepted for publication in journal Opt. Express\n\nhttps:
 //indico.inp.nsk.su/event/24/contributions/1882/
LOCATION:
URL:https://indico.inp.nsk.su/event/24/contributions/1882/
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