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SUMMARY:Metrological approach for diagnostics of x-ray refractive lenses
DTSTART;VALUE=DATE-TIME:20200715T094000Z
DTEND;VALUE=DATE-TIME:20200715T100000Z
DTSTAMP;VALUE=DATE-TIME:20260316T063310Z
UID:indico-contribution-1883@indico.inp.nsk.su
DESCRIPTION:Speakers: Anton Narikovich (IKBFU)\nOptical systems based on c
 ompound refractive lenses (CRLs) with rotationally parabolic profile [1] a
 re amongst the most advanced optical components at the novel synchrotrons 
 worldwide [2]. Methods and technologies of their production one of the mos
 t rapidly progressing areas of modern synchrotron instrumentation techniqu
 es. Manufacturing of CRLs is closely related to the analysis of technologi
 cal errors affecting on quality of their optical characteristics. The most
  important problem is the geometric deviations of the CRL refractive profi
 le from the calculated shape [3]. Therefore\, in addition to the improveme
 nt of lens manufacturing methods\, the development of metrological diagnos
 tic methods which provide accurate measurements of the geometric character
 istics of the parabolic profile of the CRL are also required.\nThis work p
 resents a comparison of various methods of metrological studies of profile
 s of X-ray refractive lenses. Application of the regression analysis allow
 s to assess the adequacy of the of proposed model of geometrical descripti
 on of the lens profile and coaxial alignment of the refracting surfaces wh
 ich determine the quality of the optical system for x-ray imaging. The dev
 eloped a comprehensive laboratory metrological approach allows controlling
  the quality of the profile shape of refractive lenses and thus significan
 tly improve their quality characterization\, by a proper adjustment of the
  CRL production process. \n\n[1] Kohn\, V.\, Snigireva\, I. & Snigirev\, A
 . Opt. Commun. (2003) 216\, 247–260\n[2] A. Snigirev\, I. Snigireva\, 
 “Hard X-ray Microoptics”\, Springer Series in Optical Sciences vol. 13
 7\, 255-285\, 2008.\n[3] A. Snigirev\, V. Kohn\, I. Snigireva and etc.\, "
 Focusing High-Energy X Rays by Compound Refractive Lenses\," Appl. Opt. 37
 \, 653-662 (1998)\n\nhttps://indico.inp.nsk.su/event/24/contributions/1883
 /
LOCATION: Zoom 890 9721 5207
URL:https://indico.inp.nsk.su/event/24/contributions/1883/
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