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SUMMARY:Development of photon diagnostic methods  for synchrotron radiatio
 n sources
DTSTART;VALUE=DATE-TIME:20200713T134500Z
DTEND;VALUE=DATE-TIME:20200713T134600Z
DTSTAMP;VALUE=DATE-TIME:20260712T181341Z
UID:indico-contribution-1890@indico.inp.nsk.su
DESCRIPTION:Speakers: Artem Khegay (BFU)\nSynchrotron radiation is the uni
 que electromagnetic radiation\, allowing the detailed study of the interna
 l structure of materials using various non-destructive methods. As is know
 n\, such radiation is characterized by exceptional brightness and coherenc
 e\, due to the choice of a specific wavelength or energy\, synchrotron lig
 ht is used in many diffraction methods [1]. \nExisting technology in parti
 cle accelerators led to the ultimate characteristics of the synchrotron ra
 diation source. Further improvement of the storage ring\, namely an increa
 sing the electron density and an increasing the brightness of light\, beco
 mes difficult [2]. Today\, 4th generation synchrotron sources considered d
 iffraction-limited\, since such sources have an electron beam emittance le
 ss than a photon beam emittance [3]. The transition to synchrotron sources
  with an ultra-small electron beam opens up new prospects in X-ray diffrac
 tion methods and coherent imaging. However\, the determination of extremel
 y small source parameters (for example «SKIF» [4])\, requires a special 
 approach and tools. Therefore\, the diagnosis of such sources becomes an i
 mportant task.\nThe interest in the diagnosis of synchrotron sources is be
 cause this tool allows you to accurately determine the parameters of the g
 enerated X-ray beam. We present a source imaging experiment carried out wi
 th different detection methods at the ESRF beamline. Photon beam diagnosti
 cs of a synchrotron radiation source can be divided into two directions: t
 he direct source imaging method and the interferometric approach. The dire
 ct imaging method allows you to get an enlarged image of the source using 
 Compound Refractive Lens (CRL) [5-6]\, Fresnel zone plate (FZP) [7]\, or p
 inhole camera [8]. The use of interference methods gives a complete image 
 of the phase structure of the photon beam. The proposed diagnostic methods
  are applicable both for the 3rd generation of synchrotron sources and for
  the 4th generation.\nThis research was supported by the Russian Science F
 oundation (Project No. 19-72-30009).\n\nReferences: \n[1] Als-Nielsen J.\,
  McMorrow D. Elements of modern X-ray physics. – John Wiley & Sons\, 201
 1. \n[2] P. Elleaume\, et al.\, “Measuring Beam Sizes and Ultra-Small El
 ectron Emittances Using an X-ray Pinhole Camera” J. Synchrotron Rad. 2 (
 1995) 209.\n[3] Ewald\, F.\, et al. "Vertical emittance measurement at the
  ESRF." MOPD61\, DIPAC 11 (2011).\n[4] V. Korchuganov\, M. Blokhov\, M. Ko
 valchuk\, et al.\, Nucl. Instrum. Methods. Phys. Res. A543\, 14 (2005).\n[
 5] Snigirev A. et al. A compound refractive lens for focusing high-energy 
 X-rays //Nature. – 1996. – Т. 384. – №. 6604. – С. 49.\n[6] Ku
 hlmann M. Hard x-ray microanalysis with parabolic refractive lenses : Bibl
 iothek der RWTH Aachen\, 2004.\n[7] Snigireva I. et al. Stacked Fresnel Zo
 ne Plates for High Energy X‐rays //AIP Conference Proceedings. – AIP\,
  2007. – Т. 879. – №. 1. – С. 998-1001.\n[8] Thomas C. et al. X-
 ray pinhole camera resolution and emittance measurement //Physical Review 
 Special Topics-Accelerators and Beams. – 2010. – Т. 13. – №. 2. 
 – С. 022805.\n\nhttps://indico.inp.nsk.su/event/24/contributions/1890/
LOCATION:
URL:https://indico.inp.nsk.su/event/24/contributions/1890/
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