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SUMMARY:STUDY THE DIAMOND THIN MEMBRANES BY X-RAY REFLECTOR-INTERFEROMETER
 Y AT THE ESRF BEAMLINE ID10
DTSTART;VALUE=DATE-TIME:20200713T143600Z
DTEND;VALUE=DATE-TIME:20200713T143700Z
DTSTAMP;VALUE=DATE-TIME:20260416T202029Z
UID:indico-contribution-1893@indico.inp.nsk.su
DESCRIPTION:Speakers: Svetlana Lyatun (Immanuel Kant Baltic Federal Univer
 sity)\nToday\, the combination of new generation X-ray sources with modern
  optical elements gives a strong impetus to the development of new researc
 h methods\, and to improve the classical methods. One such method is X-ray
  reflectometry (XRR). Despite the widespread use for thin-film structures 
 study\, XRR has a strong limitation related with the size and surface qual
 ity of the samples.\nRefractive optics is the most dynamically developing 
 kinds of X-ray optical elements [1-2]. CRLs quickly gained popularity amon
 g synchrotron sources users due to their ease of operation and the possibi
 lity of application in a wide range of energies [3-4].\nIn this work\, a n
 ew X-ray reflecto-interferometer (XRI)\, based on CRL\, was demonstrated t
 o study thin-film structures using the synchrotron X-ray source [5]. Due t
 o the CRL focusing properties\, X-rays incident on the sample surface cont
 ain the necessary range of angles for the formation of an interference pat
 tern in one shot.\nThe capabilities of the new XRI were demonstrated at th
 e ESRF ID10 beamline (Grenoble\, France). The Si3N4 and diamond membranes 
 with thicknesses 100 and 200 nm were studied using X-rays of energy 22 keV
 . Experimentally obtained reflecto-interferograms are in good agreement wi
 th calculated ones\, and the distance between fringes in the interference 
 patterns corresponds to the thickness of the tested membranes.\nThe new XR
 I opens wide horizons both for rapid thin-film and multilayer analysis and
  for studying the dynamics of processes on the surface and in the depth of
  the sample\, as well as for studying complex structured and biological sa
 mples.\nThis research was supported by the Russian Science Foundation (Pro
 ject No. 19-72- 30009). \n\n[1] Snigirev\, V. Kohn\, I. Snigireva and B. L
 engeler\, Nature\, vol. 384\, 49-51 (1996)\n[2] Snigirev\, I. Snigireva\, 
 Springer Series in Optical Sciences\, vol. 137\, 255-285 (2008)\n[3] Snigi
 rev\, V. Kohn\, I. Snigireva\, et.al.\, Appl. Opt.\, 37\, 653-662 (1998)\n
 [4] Bosak\, I. Snigireva\, K. S. Napolskii\, A. Snigirev\,  Adv.Mater.\, 2
 2\, 3256–3259 (2010)\n[5] Lyatun\, S.\, Zverev\, D.\, Ershov\, P.\, Lyat
 un\, I.\, Konovalov\, O.\, Snigireva\, I.\, & Snigirev\, A. (2019). X-ray 
 reflecto-interferometer based on compound refractive lenses. Journal of sy
 nchrotron radiation\, 26(5).\n\nhttps://indico.inp.nsk.su/event/24/contrib
 utions/1893/
LOCATION:
URL:https://indico.inp.nsk.su/event/24/contributions/1893/
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