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SUMMARY:mu-XRF for thick specimens
DTSTART;VALUE=DATE-TIME:20200713T134800Z
DTEND;VALUE=DATE-TIME:20200713T134900Z
DTSTAMP;VALUE=DATE-TIME:20260308T005715Z
UID:indico-contribution-1898@indico.inp.nsk.su
DESCRIPTION:Speakers: Vladimir Nazmov ()\nWhen studying samples without de
 struction by x-ray fluorescence analysis\, the thickness of the investigat
 ed sample is limited by the depth of total absorption of the outgoing and 
 excitation radiation. When analyzing complex geological objects containing
  high-Z atoms\, the excitation energy can reach several tens of kiloelectr
 onvolts\, which can generate x-ray fluorescent light from a depth of sever
 al hundred micrometers. However\, focused on the front plane of the sample
  the beam of excitation radiation is defocused at such depth\, and its cro
 ss-section under the conditions discussed in the report can become signifi
 cantly larger than the focus size. This effect is especially significant w
 hen the x-ray source is small\, for example\, for the SKIF synchrotron rad
 iation source. Based on the geometric model of the actinic voxel\, the con
 ditions for optimal choice of the excitation energy and focusing condition
 s of the initial x-ray beam are determined.\nThis work was supported in pa
 rt by RFBR Grant Number 17-45-540618.\n\nhttps://indico.inp.nsk.su/event/2
 4/contributions/1898/
LOCATION:
URL:https://indico.inp.nsk.su/event/24/contributions/1898/
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