BEGIN:VCALENDAR VERSION:2.0 PRODID:-//CERN//INDICO//EN BEGIN:VEVENT SUMMARY:The Application of Advanced X-Ray Diffraction Image Processing Met hods for Study Linear Defects in Silicon Single Crystals DTSTART;VALUE=DATE-TIME:20200715T100000Z DTEND;VALUE=DATE-TIME:20200715T102000Z DTSTAMP;VALUE=DATE-TIME:20260417T090333Z UID:indico-contribution-204-1024@indico.inp.nsk.su DESCRIPTION:Speakers: Denis Zolotov (Shubnikov Institute of Crystallograph y FSRC “Crystallography and Photonics” RAS)\, Irina Dyachkova (FSRC "C rystallography and Photonics" RAS)\nThe visualization and analysis of 3D f ields of elastic displacements of micro-dimensional defects and dislocatio n structures in the volume of single crystals are important in the develop ment of new functional materials. For this purpose\, the X-ray diffraction tomography (XRDT) method is increasingly being used. We use XRDT to study the real structure of different single crystals\, in particular\, to visu alize the spatial location of dislocation half-loops in Si (111) single cr ystal obtained by a four-point bending method [1]. The currently used math ematical algorithms of XRDT data processing are the evolution of absorptio n tomography methods. Thus\, there is a motivation to modify already exist ing algorithms for processing experimental results in order to develop new mathematical software based on them for modeling images of micro-dimensio nal defects in crystals. The tools of X-ray diffraction theory\, as well a s modern methods of digital image processing can be used for interpretatio n of the obtained data. \n \nThe specific feature of XRDT measurements is the impossibility to register a direct beam or its analogue (flatfield correction)\, which could be used to correct the background of the resulti ng projections. In this work\, we propose a statistical method of analyzin g diffraction projections to separate the noise component of the backgroun d (scattered radiation\, dark current of detector\, etc.) from the useful signal. \n \nIn particular\, an approach using antialiasing the backgro und signal with the Hamming's kernel in a 2D implementation has been propo sed. It is proposed to use an algorithm for statistical recognition using Kendall’s rank correlation criterion to recognize the boundaries and pea ks in the images. Kendall’s statistic and the concordation coefficient a re calculated inside the scan window of the specified width. In this case\ , only image trends\, i.e. relative intensity values\, are compared. \n \nThe results of filtration depend to a large extent on the accuracy of n oise dispersion estimation in the raw data. The main quality criterion of the solution is the value of the residual autocorrelation\, which should c orrespond to a sample from a random sequence. The Durbin-Watson autocorrel ation criterion [2] and several semi-empirical criteria based on the analy sis of the curvature of the smoothed curve and the relative value of the s ystematic component in the residues were chosen as the estimation. \n \ nThe application of developed algorithms and software for effective automa tic noise filtering and smoothing of 2D diffraction projections using the criteria of difference autocorrelation significantly improves 3D reconstru ction result of the dislocation half-loops in Si (111) single crystal. \ n \nThis work was supported by Russian Foundation for Basic Research (pro ject 19-02-00556 A) in the part of image processing and the Ministry of Sc ience and Higher Education within the State assignment FSRC “Crystallogr aphy and Photonics” RAS in part of applying tomography algorithms. \nR eferences \n1\\. V. Asadchikov\, A. Buzmakov\, F. Chukhovskii et al\, J. Appl. Cryst. 51\, 1616 (2018). \n2\\. J. Durbin\, Biometrika 58\, 1 (19 71).\n\nhttps://indico.inp.nsk.su/event/24/contributions/1024/ LOCATION: Zoom 890 9721 5207 URL:https://indico.inp.nsk.su/event/24/contributions/1024/ END:VEVENT BEGIN:VEVENT SUMMARY:“Electronic Structure” beamline 1-6 at SKIF synchrotron facili ty. DTSTART;VALUE=DATE-TIME:20200715T082000Z DTEND;VALUE=DATE-TIME:20200715T084000Z DTSTAMP;VALUE=DATE-TIME:20260417T090333Z UID:indico-contribution-204-1027@indico.inp.nsk.su DESCRIPTION:Speakers: Andrey Bukhtiyarov (Boreskov Institute of Catalysis) \n“Electronic Structure” is a state-of-the-art beamline for methods us ing the Soft X-Rays range (10-2000 eV) at the 3 GeV ring of SKIF synchrotr on facility. At present\, three branch lines is funded\, which will host a n end station for Near Ambient pressure X-Ray Photoelectron Spectroscopy ( NAP XPS)\, Spin-Angle Resolved Photo-Emission Spectroscopy (Spin-ARPES) an d Reflectometry and Metrology. The NAP XPS end station will allow carrying out in situ and operando studies of the composition and electronic struct ure of the active component for a wide range of catalytic systems at eleva ted pressure\; in situ studies of regularities of deactivation/poisoning p rocesses for catalytic systems depending on different conditions (composit ion of the reaction mixture\, temperature\, the presence of toxic agents\, etc.)\; also in situ study of innovative functional materials. Another im portant technique which will be realized on a beam line (the other branch line) is Spin-Angle Resolved Photo-Emission Spectroscopy (Spin-ARPES) end station will allows to study the electronic and spin structure of solids f or applications in nanoelectronics and spintronics. The third end station is Reflectometry and Metrology (the third branch line) end station will be used for certification of spectral optical elements\, focusing elements a nd X-ray detectors\; a reference detector method for absolute calibration of the spectral sensitivity of various kinds of X-ray radiation receivers in the VUV and Soft X-Rays ranges\; a set of metrological techniques for c alibrating the main characteristics of various kinds of X-ray detectors.\n \nhttps://indico.inp.nsk.su/event/24/contributions/1027/ LOCATION: Zoom 890 9721 5207 URL:https://indico.inp.nsk.su/event/24/contributions/1027/ END:VEVENT BEGIN:VEVENT SUMMARY:Evaluation of CCD detector absolute responsivity with the aid of s ynchrotron radiation DTSTART;VALUE=DATE-TIME:20200715T102000Z DTEND;VALUE=DATE-TIME:20200715T104000Z DTSTAMP;VALUE=DATE-TIME:20260417T090333Z UID:indico-contribution-204-1797@indico.inp.nsk.su DESCRIPTION:Speakers: Eugene Vishnyakov (P.N.Lebedev Physical Institute of RAS)\nWe have employed VEPP-4 synchrotron radiation to measure CCD detect or absolute responsivity in vacuum ultraviolet (115-310 nm) spectral rang e. The detector is designed in the form of a stainless steel enclosure con taining a backside-illuminated CCD to protect the CCD from contamination. The entrance window of the enclosure is a round MgF2 spectral filter trans parent for ultraviolet radiation with wavelengths longer than 112 nm. The measurements were carried out at Kosmos Metrological Station at the opera ting temperature of -100°C on the sensitive surface of the CCD. We utiliz ed SPD calibrated silicon photodiode with 1 cm2 sensitive area and a know n spectral sensitivity profile as a reference detector. The resultant meas urements show a clear CCD responsivity dip near 280 nm\, and a great pote ntial to improve the CCD responsivity values using specially designed anti -reflection coatings.\n\nhttps://indico.inp.nsk.su/event/24/contributions/ 1797/ LOCATION: Zoom 890 9721 5207 URL:https://indico.inp.nsk.su/event/24/contributions/1797/ END:VEVENT BEGIN:VEVENT SUMMARY:Generation and use of coherent X-ray beams at future SKIF storage ring DTSTART;VALUE=DATE-TIME:20200715T070000Z DTEND;VALUE=DATE-TIME:20200715T072000Z DTSTAMP;VALUE=DATE-TIME:20260417T090333Z UID:indico-contribution-204-1860@indico.inp.nsk.su DESCRIPTION:Speakers: Sergey Rashchenko (Novosibirsk State University)\nIn 1990s\, the emergence of the 3rd generation synchrotron user facilities e quipped with undulator sources\, stimulated pioneering works on interactio n of coherent X-ray beams with matter (Brauer et al. 1995)\, resulted in t he development of X-ray photon correlation spectroscopy (XPCS) technique\, capable to probe nanoscale fluctuations up to kHz frequencies using dynam ics of speckle pattern given by scattering of coherent X-ray beam from the sample. More recently (and highly aided by the development of modern high -throughput data analysis algorithms)\, coherent X-ray diffraction imaging (CXDI)\, also known as lensless imaging\, revolutionized the field of X-r ay microscopy\, finally bringing users the possibility of non-destructive 2D and 3D imaging of complex structures with unprecedented ~10 nm resoluti on. However\, strict requirements to transverse coherence of X-ray probe p ut serious limits on further development of CXDI-based techniques at the 3 rd generation facilities\, where coherent flux after spatial filtering bec omes unacceptably small at energies above ~20 keV. At the same time\, the latter was used as one of the strongest arguments of the user community fo r push towards construction of MBA-based 4th generation of storage rings w ith ultra-low-emittance.\nSince coherent flux can be simply expressed as $ F_{coh}={\\lambda^2\\over4}B$\, where $\\lambda$ is X-ray wavelength\, and *B* – source brightness\, the demand for higher coherent flux is often translated as demand for higher brightness – a recognizable motto for bo th accelerator and user communities. From the same relationship one can al so easily see that even more brightness is needed to obtain the same coher ent flux at shorter wavelengths / higher energies. Another expression $F_{ coh}={\\lambda^2\\over 16\\pi^2}F/\\varepsilon_{tot}$\, where *F* is total flux\, and $\\varepsilon_{tot}$ – 4D phase volume of X-ray beam\, illus trates that it is the phase volume of the undulator X-ray source that shou ld be minimized in order to deliver a maximum number of coherent photons t o end-user (given total flux has already reached its limit imposed by mach ine current and undulator technology). Whereas at the 3rd generation facil ities the phase volume of undulator source was dominated by electron beam emittance with negligible influence of other factors\, the estimation and minimization of undulator source phase volume at 4th generation facilities requires more elaborate approach taking into account electron beam energy spread\, undulator phase error\, and matching of phase-space ellipses bet ween electron and X-ray beams.\nIn our contribution we will present estima tions of coherent flux at different energies available for future users of ultra-low-emittance SKIF storage ring (to be commissioned in 2023) and di scuss ways of its optimization\, as well as future scientific program of u ser experiments with diffraction-limited X-ray beams.\n\nBrauer\, S.\, Ste phenson\, G.B.\, Sutton\, M.\, Brüning\, R.\, Dufresne\, E.\, Mochrie\, S .G.J.\, Grübel\, G.\, Als-Nielsen\, J.\, and Abernathy\, D.L. (1995) X-Ra y Intensity Fluctuation Spectroscopy Observations of Critical Dynamics in F${\\mathrm{e}}_{3}$Al. Physical Review Letters\, 74\, 2010–2013.\n\nhtt ps://indico.inp.nsk.su/event/24/contributions/1860/ LOCATION: Zoom 890 9721 5207 URL:https://indico.inp.nsk.su/event/24/contributions/1860/ END:VEVENT BEGIN:VEVENT SUMMARY:The modification of optical properties of the surfaces by the glan cing angle deposition of TiO2 DTSTART;VALUE=DATE-TIME:20200715T104000Z DTEND;VALUE=DATE-TIME:20200715T110000Z DTSTAMP;VALUE=DATE-TIME:20260417T090333Z UID:indico-contribution-204-1857@indico.inp.nsk.su DESCRIPTION:Speakers: Aleksey Lemzyakov (Budker INP SB RAS)\nThis work con siders the optical properties and structure of thin films of titanium diox ide formed by glancing angle deposition to improve light yield of scintill ation materials. The experimentally obtained value of the refractive index was about 1.2\, which is almost two times less than the refractive index of crystalline titanium dioxide. This allows you to use this method to mod ify the optical properties of the surfaces of scintillators with a large r efractive index.\nThis work is partially supported by RFBR grant №19-42- 540009 p_a.\n\nhttps://indico.inp.nsk.su/event/24/contributions/1857/ LOCATION: Zoom 890 9721 5207 URL:https://indico.inp.nsk.su/event/24/contributions/1857/ END:VEVENT BEGIN:VEVENT SUMMARY:Beam-shaping refractive optics for coherent X-ray sources DTSTART;VALUE=DATE-TIME:20200715T084000Z DTEND;VALUE=DATE-TIME:20200715T090000Z DTSTAMP;VALUE=DATE-TIME:20260417T090333Z UID:indico-contribution-204-1881@indico.inp.nsk.su DESCRIPTION:Speakers: Dmitry Zverev (Immanuel Kant Baltic Federal Universi ty)\nThe most advanced X-ray sources\, such as third-generation synchrotro ns and free electron lasers (XFEL)\, are capable to generate high brightne ss coherent radiation\, especially in the hard X-ray region. The availabil ity of such beams facilitates the development of a new generation of X-ray optics\, whose optical properties allow going far beyond simple collimati on and focusing functions. This optics makes it possible to form amplitude and phase of wave front with almost complete freedom\, using the most out standing properties of synchrotron and X-ray laser radiation such as brigh tness\, monochromaticity\, and coherence.\nLike in visible light optics\, beam-shaping functions can be implemented in an X-ray regime based on both diffraction and refractive optical elements. For example\, the beam-shapi ng optics based on diffraction optical elements (DOEs) allows realizing al most any complex optical transformation. However\, due to the high penetra ting power of X-rays through DOEs their use is significantly limited in th e hard energy range. In addition\, since many unknown beam parameters must be defined in advance\, the design of such beam-shaping optical elements is a challenging task. As for the beam-shaping elements based on refractiv e optics [1]\, they are deprived of the disadvantages which are inherent i n DOEs. This optics allows for some beam transformations\, and the possibi lities of its applications cover various areas of modern X-ray optics\, su ch as interferometry and coherent diffraction\, phase-contrast microscopy and imaging\, and ultrafast and nonlinear optics studies.\nFor example\, o ne of the most vibrant demonstrations of the beam-shaping optics is a spec ial class of refractive optical elements that have axial symmetry and are capable to convert a point-like source to a narrow axial straight line seg ment. These optical elements are called axicons. Recently\, we demonstrate d an X-ray parabolic refractive axicon lens as a novel type of X-ray beam- shaping element [2]. Under coherent X-ray illumination\, the parabolic axi con generates Bessel-like beam propagated along the optical axis in the ne ar field and ring-shaped beam in the far field.\nThe optical transformatio ns produced by axicon can be used in areas requiring special illumination\ , as well as extended focused beams\, for instance\, in diffraction and im aging techniques\, in metrological applications\, as well as for source di agnostics and beamline alignment. Moreover\, such beam-shaping capabilitie s can significantly simplify some existing experimental layouts or lead to completely new optical schemes for X-ray techniques based on synchrotron and XFEL sources. Most recently\, we proposed an optical scheme of phase-c ontrast microscopy technique based on the axicon optics [3]. Due to the un ique optical properties of the parabolic refractive axicon lens\, the new approach turned out to be more efficient for visualization of weakly absor bing samples as compared with the traditional microscopy technique.\nIn ad dition to new X-ray axicon refractive optics\, it is also worthwhile to co nsider other beam-shaping elements\, called interferometers\, whose optica l functions are well known and successfully used. These devices allow real izing the paraxial optical schemes of interferometry based on the coherent properties of modern X-ray sources. Recently\, we demonstrated bilens and multilens interferometers based on refractive optics which under coherent illumination generate an array of mutually coherent beams focused at some distance [4-5]. The size of the focal spots is restricted to the diffract ion limit and can be less than tens of nanometers. When the beams overlap they produce a steady interference pattern of fringes in the far field.\nT he proposed interferometers can be used in a wide X-ray energy range while maintaining high efficiency. The field of applications of their optical f unctions is not limited only to the interferometry techniques and can be e xtended in the area of beam diagnostics and beam conditioning. Moreover\, such lens systems open up new opportunities for the development of phase-c ontrast imaging technique\, which was recently demonstrated [6].\n\n[1] Sn igirev\, A.\, Kohn\, V.\, Snigireva\, I.\, & Lengeler\, B. (1996). A compo und refractive lens for focusing high-energy X-rays. Nature\, 384(6604)\, 49-51.\n[2] Zverev\, D.\, Barannikov\, A.\, Snigireva\, I.\, & Snigirev\, A. (2017). X-ray refractive parabolic axicon lens. Optics Express\, 25(23) \, 28469-28477.\n[3] Zverev\, D.\, Snigireva\, I.\, & Snigirev\, A. (2018) . X-ray Phase Contrast Microscopy Based on Parabolic Refractive Axicon Len s. Microscopy and Microanalysis\, 24(S2)\, 296-297.\n[4] Snigirev\, A.\, S nigireva\, I.\, Kohn\, V.\, Yunkin\, V.\, Kuznetsov\, S.\, Grigoriev\, M. B.\, ... & Detlefs\, C. (2009). X-ray nanointerferometer based on Si refra ctive bilenses. Physical review letters\, 103(6)\, 064801.\n[5] Snigirev\, A.\, Snigireva\, I.\, Lyubomirskiy\, M.\, Kohn\, V.\, Yunkin\, V.\, & Kuz netsov\, S. (2014). X-ray multilens interferometer based on Si refractive lenses. Optics express\, 22(21)\, 25842-25852.\n[6] Zverev D.\, Snigireva I.\, Kohn V.\, Kuznetsov S.\, Yunkin V.\, Snigirev A.\, (2020) X-ray phase -sensitive imaging using a bilens interferometer based on refractive optic s. Accepted for publication in journal Opt. Express\n\nhttps://indico.inp. nsk.su/event/24/contributions/1881/ LOCATION: Zoom 890 9721 5207 URL:https://indico.inp.nsk.su/event/24/contributions/1881/ END:VEVENT BEGIN:VEVENT SUMMARY:Metrological approach for diagnostics of x-ray refractive lenses DTSTART;VALUE=DATE-TIME:20200715T094000Z DTEND;VALUE=DATE-TIME:20200715T100000Z DTSTAMP;VALUE=DATE-TIME:20260417T090333Z UID:indico-contribution-204-1883@indico.inp.nsk.su DESCRIPTION:Speakers: Anton Narikovich (IKBFU)\nOptical systems based on c ompound refractive lenses (CRLs) with rotationally parabolic profile [1] a re amongst the most advanced optical components at the novel synchrotrons worldwide [2]. Methods and technologies of their production one of the mos t rapidly progressing areas of modern synchrotron instrumentation techniqu es. Manufacturing of CRLs is closely related to the analysis of technologi cal errors affecting on quality of their optical characteristics. The most important problem is the geometric deviations of the CRL refractive profi le from the calculated shape [3]. Therefore\, in addition to the improveme nt of lens manufacturing methods\, the development of metrological diagnos tic methods which provide accurate measurements of the geometric character istics of the parabolic profile of the CRL are also required.\nThis work p resents a comparison of various methods of metrological studies of profile s of X-ray refractive lenses. Application of the regression analysis allow s to assess the adequacy of the of proposed model of geometrical descripti on of the lens profile and coaxial alignment of the refracting surfaces wh ich determine the quality of the optical system for x-ray imaging. The dev eloped a comprehensive laboratory metrological approach allows controlling the quality of the profile shape of refractive lenses and thus significan tly improve their quality characterization\, by a proper adjustment of the CRL production process. \n\n[1] Kohn\, V.\, Snigireva\, I. & Snigirev\, A . Opt. Commun. (2003) 216\, 247–260\n[2] A. Snigirev\, I. Snigireva\, “Hard X-ray Microoptics”\, Springer Series in Optical Sciences vol. 13 7\, 255-285\, 2008.\n[3] A. Snigirev\, V. Kohn\, I. Snigireva and etc.\, " Focusing High-Energy X Rays by Compound Refractive Lenses\," Appl. Opt. 37 \, 653-662 (1998)\n\nhttps://indico.inp.nsk.su/event/24/contributions/1883 / LOCATION: Zoom 890 9721 5207 URL:https://indico.inp.nsk.su/event/24/contributions/1883/ END:VEVENT BEGIN:VEVENT SUMMARY:Conceptual design of the "Fast Processes" beamline at the SRF SKIF 4th generation synchrotron DTSTART;VALUE=DATE-TIME:20200715T074000Z DTEND;VALUE=DATE-TIME:20200715T080000Z DTSTAMP;VALUE=DATE-TIME:20260417T090333Z UID:indico-contribution-204-1904@indico.inp.nsk.su DESCRIPTION:Speakers: Ivan Rubtsov (Lavrentyev Institute of Hydrodynamics of the Siberian Branch of the Russian Academy of Sciences)\n“Fast Proces ses” is one out of six 1st priority beamlines that are planned for const ruction within the project SRF SKIF (Shared Research Facility “Siberian circular photon source") [1]. The beamline would include two independent i nstruments installed at a wiggler source\, i.e.\, Dynamic processes and Pl asma. The beamline is designed to meet a wide range of research and techno logical challenges related to processes occurring in nano- and microsecond timescales. The current conceptual design of the beamline aims at a compl ex approach to structural studies of various objects relying on high-brigh tness synchrotron radiation beams.\nThe beamline would implement X-ray dif fraction\, small-angle scattering\, and radiography techniques with a high temporal resolution\, with a typical delay between frames down to 2.8 ns and exposures of about 50 ps.\nThe assortment of scientific problems to be solved at the beamline includes studies of detonation processes\; impact of explosion and shock waves on structural materials\; dynamic endurance a nd fracture emergence\; influence of laser irradiation and plasma on a var iety of substances. The aforementioned synchrotron-based techniques will a llow us to track structural changes along the detonation and shock-wave fr ont\, detect the formation of nanoparticles from explosion products (e.g.\ , nanodiamonds)\, and elucidate the phase composition and local structure of substances subjected to extreme dynamic impacts.\n \n[1] http://srf-ski f.ru\n\nhttps://indico.inp.nsk.su/event/24/contributions/1904/ LOCATION: Zoom 890 9721 5207 URL:https://indico.inp.nsk.su/event/24/contributions/1904/ END:VEVENT BEGIN:VEVENT SUMMARY:The design of «Structural Diagnostics» beamline for SRF «SKIF» DTSTART;VALUE=DATE-TIME:20200715T072000Z DTEND;VALUE=DATE-TIME:20200715T074000Z DTSTAMP;VALUE=DATE-TIME:20260417T090333Z UID:indico-contribution-204-1026@indico.inp.nsk.su DESCRIPTION:Speakers: Boris Zakharov (Boreskov Institute of Catalysis SB R AS\, Novosibirsk State University)\nThe design of the user station for a f ourth-generation synchrotron radiation (SR) source SRF “SKIF” has been proposed. The station is designed to solve a wide range of research and t echnological tasks using X-ray diffraction techniques. The concept of the station is based on the implementation of a complex approach to the struct ural studies of synthetic and natural objects. The most complete set of ex perimental diffraction techniques will allow one to benefit from the uniqu e advantages of a modern SR source\, including advanced X-ray optic soluti ons\, high SR brightness and efficient X-ray detectors. \n \nSupercondu cting undulator with a magnetic period of 15.6 mm\, an interpolar gap of 8 mm and a total length of 2 m will be used as insertion device (ID). In th e main mode the magnetic field in the undulator will be 1.06 T (K = 1.54) giving SR harmonics generation with a step of 2.5 keV. The station include s four sections: High-resolution powder diffraction (section 1-2-1)\; In s itu diffraction (section 1-2-2)\; Single-crystal X-ray diffraction (sectio n 1-2-3)\; Small angle X-ray scattering (section 1-2-4). In the main opera ting mode of the ID all the sections are supposed to work simultaneously. This is achieved by splitting the components of the SR spectrum between di fferent sections by three beam multiplexing monochromators (beam splitters ). Flat diamond plates with an (111) orientation and a thickness of about 100 μm will be used to split the beam. The components of ID spectrum with energies of 12.50 keV / 0\, 99 Å\, 22.50 keV / 0.55 Å and 32.50 keV / 0 .38 Å will be directed to side sections of the station at angles of 28\, 15 and 11° with respect to primary beam. For the experiments requiring en ergy scanning an alternative mode will be used provided by the possibility of the change of the magnetic field in the undulator. In this mode the un dulator radiation transmitted to only 1-2-1 section due to the restriction s of the multibranch optical design. To obtain the necessary beam paramete rs we plan to use the refractive X-ray optics beryllium\, diamond or alumi num lenses depending on beam energy. To detect diffraction pattern\, we pr opose to use modern hybrid-type detectors based on sensors made of silicon or cadmium telluride for high energy applications. \n \n**Acknowledgem ents** \n \nThe work was supported by Ministry of Science and Higher Ed ucation of the Russian Federation (grant No. АААА-А19-119020890025-3) .\n\nhttps://indico.inp.nsk.su/event/24/contributions/1026/ LOCATION: Zoom 890 9721 5207 URL:https://indico.inp.nsk.su/event/24/contributions/1026/ END:VEVENT BEGIN:VEVENT SUMMARY:In situ XRD analysis with the time-resolution (0.4 ms) of stainles s steel in during selective laser melting. DTSTART;VALUE=DATE-TIME:20200715T080000Z DTEND;VALUE=DATE-TIME:20200715T082000Z DTSTAMP;VALUE=DATE-TIME:20260417T090333Z UID:indico-contribution-204-1859@indico.inp.nsk.su DESCRIPTION:Speakers: Konstantin Kuper ()\nSelective laser melting is an a dditive technology that is gaining popularity due to its ability to produc e complex metal components that cannot be manufactured using traditional t echnologies.To achieve high quality components created using SLM\, it is n ecessary to control the processes of melting and subsequent crystallizatio n in metals. Using the high synchrotron radiation (SR) intensity from a 9- pole wiggler (VEPP-4M)\, we obtained data on phase transformations in AISI 304 stainless steel with a time resolution of 0.4 ms. For SLM\, we used a 500 W ytterbium fiber laser with a wavelength 1070 nm. \, The work was pe rformed on the SR beamline "Phase Contrast Radiography"\, created with th e support of the RFBR project No. 12-02-12071\n\nhttps://indico.inp.nsk.su /event/24/contributions/1859/ LOCATION: Zoom 890 9721 5207 URL:https://indico.inp.nsk.su/event/24/contributions/1859/ END:VEVENT BEGIN:VEVENT SUMMARY:Trends on Montel X-ray Optics and Pinholes for Synchrotron Beamlin es DTSTART;VALUE=DATE-TIME:20200715T092000Z DTEND;VALUE=DATE-TIME:20200715T094000Z DTSTAMP;VALUE=DATE-TIME:20260417T090333Z UID:indico-contribution-204-1909@indico.inp.nsk.su DESCRIPTION:Speakers: Jörg Wiesmann (Incoatec GmbH)\nDifferent kinds of X -ray mirrors are required for beam alignment\, guidance or monochromator a pplications. Therefore various types of optics with coatings for energy ra nges between 100 eV and 80 keV have been investigated. \nWe will show stri pe multilayer coatings which are often used as Double Crystal Multilayer M onochromators (DCMM) for example in tomography beamlines. The optics consi sts of up to 5 different coating stripes\, optimized for each energy range . \nWe will also present results of a 50 cm laterally graded multilayer op tics\, developed for special mini-synchrotrons with a deviation to a speci fied film shape of less than 0.2 %.\nWe will present new developments of M ontel Optics for synchrotron applications. Different types of these two-di mensional optics are used at DLS\, NSLS and APS and Riken\, for example in an analyzer system for inelastic scattering. One new 230 mm Montel Optic for 11215 eV was delivered a few months ago to ESRF for BL ID20.\nParasiti c aperture scattering causes loss in data quality especially in SAXS and G ISAXS ap-plications. Various measurement results will be presented showing the improvement of data quality with scatterless pinholes. These pinholes are either made of Germanium for energies 11.2 keV and are available wit h diameters from 2 mm down to 20 µm and below.\n\nhttps://indico.inp.nsk. su/event/24/contributions/1909/ LOCATION: Zoom 890 9721 5207 URL:https://indico.inp.nsk.su/event/24/contributions/1909/ END:VEVENT END:VCALENDAR