BEGIN:VCALENDAR VERSION:2.0 PRODID:-//CERN//INDICO//EN BEGIN:VEVENT SUMMARY:What does the macromolecular crystallography users community expec t from the modern synchrotron source? DTSTART;VALUE=DATE-TIME:20200715T114000Z DTEND;VALUE=DATE-TIME:20200715T114100Z DTSTAMP;VALUE=DATE-TIME:20260419T150822Z UID:indico-contribution-211-1826@indico.inp.nsk.su DESCRIPTION:Speakers: Sergey Arkhipov (Novosibirsk State University)\nВ докладе будут рассмотрены основные потр ебности пользователей синхротронного и злучения\, задачей которых является рент геноструктурный анализ монокристаллов биополимеров (белков\, нуклеиновых кисло т и их комплексов) и дальнейшая расшифро вка структуры\, необходимая для решения изначально поставленной биологической задачи. Для сбора информации автор консу льтировался с исследователями\, регуляр но проводящими эксперименты на станциях различных синхротронов (ESRF\, DESY\, SSRF\, Spring- 8\, MAX IV)\, изучал тематическую литературу и информацию представленную в базе данн ых кристаллических структур биополимер ов (PDB\, protein data bank). Будут затронуты техник и сбора данных и доставки кристаллов для метода "серийной синхротронной кристал лографии" (SSX) и требуемое для этого обору дование\, подходы к уменьшения радиацион ного разрушения образца\, значение крист аллизационных комнат в непосредственно й близости от синхротрона\, методы транс портировки кристаллов на экспериментал ьную станцию\, подходы к сбору данных без извлечения кристаллов из кристаллизаци онного резервуара.\n\nhttps://indico.inp.nsk.su/event/24/c ontributions/1826/ LOCATION: Zoom 890 9721 5207 URL:https://indico.inp.nsk.su/event/24/contributions/1826/ END:VEVENT BEGIN:VEVENT SUMMARY:Beamline instrumentation at SKIF by JJ X-Ray DTSTART;VALUE=DATE-TIME:20200715T112000Z DTEND;VALUE=DATE-TIME:20200715T114000Z DTSTAMP;VALUE=DATE-TIME:20260419T150822Z UID:indico-contribution-211-1808@indico.inp.nsk.su DESCRIPTION:Speakers: Paw Kristiansen (JJ X-ray)\nA short introduction to JJ X-Ray and the potential collaboration for beamline instrumentation with SKIF. \nJJ-X Ray is a Danish company situated at DTU Science Park near Co penhagen. JJ X-ray specializes in developing\, designing and producing adv anced components and assemblies for x-ray\, synchrotron radiation\, FEL an d neutron instrumentation. In particular\, JJ X-Ray is scientifically invo lved in instrument developments at various large-scale synchrotron\, X-FEL and neutron facilities worldwide\, with strong emphasis on the research a mbitions for the instruments. Among the more standard competences are slit s systems\, diamond-based optics and precision motion control stages.\n\nh ttps://indico.inp.nsk.su/event/24/contributions/1808/ LOCATION: Zoom 890 9721 5207 URL:https://indico.inp.nsk.su/event/24/contributions/1808/ END:VEVENT BEGIN:VEVENT SUMMARY:X-ray diffractometers and spectrometers Bruker AXS for materials r esearch DTSTART;VALUE=DATE-TIME:20200713T115000Z DTEND;VALUE=DATE-TIME:20200713T121000Z DTSTAMP;VALUE=DATE-TIME:20260419T150822Z UID:indico-contribution-211-1876@indico.inp.nsk.su DESCRIPTION:Speakers: Alexandr Shevchukov (Melytec LLC)\nBruker AXS x-ray diffraction and scattering portfolio enables detailed analysis of any mate rial from fundamental research to industrial quality control providing for ward looking solutions to customers today. Applications of these qualitati ve and quantitative techniques include: phase identification\, quantitativ e analysis\, crystal structure determination\, pdf analysis (total scatter ing)\, small angle x-ray scattering\, x-ray reflectometry\, high resolutio n x-ray diffraction\, reciprocal space mapping\, residual stress\, texture . XRF spectrometers Bruker AXS combines highest accuracy and precision wit h simple and fast sample preparation for the analysis of elements from Ber yllium (Be) to Uranium (U) in the concentration range from 100 % down to t he sub-ppm-level.\n\nhttps://indico.inp.nsk.su/event/24/contributions/1876 / LOCATION:Zoom Zoom 860 5034 1820 URL:https://indico.inp.nsk.su/event/24/contributions/1876/ END:VEVENT BEGIN:VEVENT SUMMARY:Customized Testing Systems for Beamlines DTSTART;VALUE=DATE-TIME:20200713T121000Z DTEND;VALUE=DATE-TIME:20200713T123000Z DTSTAMP;VALUE=DATE-TIME:20260419T150822Z UID:indico-contribution-211-1850@indico.inp.nsk.su DESCRIPTION:Speakers: Alexandr Dolgikh ()\nMaterial testing mostly common carried out after irradiation the sample using classical standalone labora tory grade testing machines due to size limitations near the beamlines. Ho wever\, the most valuable results could be recieved within simultaneous ir radiation and mechanical stress.\n50+ years of experience in development a nd productoin of material testing systems made possible to create special designed\, compact and reliable solutions. \n(The machines are used by: Sy nchrotron Radiation Facility ANKA\, Photon source BESSY II\, Technical Uni versity of Munich & FRM II Neutron Facility\, University of Science and Te chnology Beijing (USTB) & Shanghai Synchrotron Radiation Facility (SSRF))\ n\nhttps://indico.inp.nsk.su/event/24/contributions/1850/ LOCATION:Zoom Zoom 860 5034 1820 URL:https://indico.inp.nsk.su/event/24/contributions/1850/ END:VEVENT BEGIN:VEVENT SUMMARY:Optically coupled X-Ray imaging system\, from microscopy to macros copy DTSTART;VALUE=DATE-TIME:20200713T113000Z DTEND;VALUE=DATE-TIME:20200713T115000Z DTSTAMP;VALUE=DATE-TIME:20260419T150822Z UID:indico-contribution-211-1905@indico.inp.nsk.su DESCRIPTION:Speakers: Xavier Rochet (Optique Peter)\nOptically coupled X-R ay imaging systems exist for years\, mostly dedicated to a given range of magnification that can be arbitrary split in two families with a boundary between 1X to 4X magnification\nOptical coupling allows to limit the numbe r of components located in the X-Ray beam axis\, thus interesting for high flux and high energies X-Ray imaging applications\n- X-Ray imaging micros copes for higher magnifications\n- X-Ray imaging macroscopes for lower mag nifications\nX-Ray imaging microscopes are designed for years on the same optical setup as most standard biological and material microscopes : infin ite corrected microscope objectives associated with imaging tube lens. Spe cific radiation hardened objectives have been designed to avoid objective browning under X-Ray\, Near UV microscope have been recently designed for fast imaging applications.\nX-Ray imaging macroscopes are either designed on single objective or tandem objective configurations\, each solution hav ing its advantages and drawbacks\nNew optical design allow to propose a ra nge of high resolution / high Numerical Aperture X-Ray imaging systems in the magnification range located between microscopy and macroscopy\nThose i nstruments can be single or multiple resolution.\nOthers setups allow to c ombine zoom systems for low magnification to dedicated high resolution/hig h magnification microscope objectives\n\nhttps://indico.inp.nsk.su/event/2 4/contributions/1905/ LOCATION:Zoom Zoom 860 5034 1820 URL:https://indico.inp.nsk.su/event/24/contributions/1905/ END:VEVENT BEGIN:VEVENT SUMMARY:EIGER2 DETECTOR SYSTEMS: TOOLS FOR ADVANCED X-RAY STUDIES DTSTART;VALUE=DATE-TIME:20200715T110000Z DTEND;VALUE=DATE-TIME:20200715T112000Z DTSTAMP;VALUE=DATE-TIME:20260419T150822Z UID:indico-contribution-211-1795@indico.inp.nsk.su DESCRIPTION:Speakers: Stefan Brandstetter (DECTRIS Ltd.)\nIn the last deca de\, Hybrid Photon Counting (HPC) X-ray detectors [1] have transformed syn chrotron research. They provide noise-free detection and make new data acq uisition modes possible. The new HPC detector family EIGER2 enables even m ore ambitious X-ray science. These detectors combine all advantages of pre vious generations of HPC detectors\nwhile offering new features and improv ed performance: maximum count rates of $10^{7}$ photons per pixel\, two en ergy discriminating thresholds\, and zero readout dead time.\n\nThe system s have pixel sizes of 75 µm × 75 µm\, and feature frame rates up to 2 k Hz. EIGER2 detectors are available both with silicon and with CdTe sensors to provide high quantum efficiency at energies up to 100 keV. Two adjusta ble energy thresholds allow for reduction of high-energy background such a s from cosmic radiation or higher harmonics. These benefits advance establ ished methods like crystallography and small angle X-ray scattering and em power new fields of research\, such as X-ray photon correlation spectrosco py and coherent studies.\n\nWe will present results from detector characte rization and application experiments and show how EIGER2 detector systems enable further advances in X-ray micro- and nanoanalysis.\n\n**References* *\n[1] A. Förster et al.\, Philos. Trans. R. Soc. Math. Phys. Eng. Sci. 3 77\, 20180241 (2019)\,\ndoi:10.1098/rsta.2018.0241.\n\nhttps://indico.inp. nsk.su/event/24/contributions/1795/ LOCATION: Zoom 890 9721 5207 URL:https://indico.inp.nsk.su/event/24/contributions/1795/ END:VEVENT END:VCALENDAR