BEGIN:VCALENDAR VERSION:2.0 PRODID:-//CERN//INDICO//EN BEGIN:VEVENT SUMMARY:SR micro-XRF installation on VEPP-3 storage ring. Possibilities in increasing the spatial resolution. DTSTART;VALUE=DATE-TIME:20160705T090000Z DTEND;VALUE=DATE-TIME:20160705T100000Z DTSTAMP;VALUE=DATE-TIME:20260416T015751Z UID:indico-contribution-1284@indico.inp.nsk.su DESCRIPTION:Speakers: Dmitry Sorokoletov (Budker Institute of Nuclear Phys ics SB RAS)\nTo investigate the possibility of increasing the spatial reso lution of the installation "SR micro-XRF" [1]\, we conducted earlier an ex periment on the elemental mapping of one-dimensional test sample (a fragme nt of an RF bipolar transistor chip\, containing a number of gold stripes) \, as well as processing of some of the experimental results (one mapping line) [2-3] using the classical Tikhonov regularization algorithm [4\, p. 73]. In this work we present the results of the processing of all data of this experiment (by two variational realizations [4\, p. 119] of the Tikho nov algorithm) and a detailed analysis of the results. For example\, we pe rformed a numerical simulation of the direct and inverse deconvolution pro blems. We did that for cases with different resolutions\, to study the pla usibility of the results of solving the deconvolution problem. We also ana lyzed the influence of certain effects that cause systematic errors in the calculations and the resulting solution.\n\nAs a result of this work\, we found out that it was very difficult to practically increase the spatial resolution 3 times (which corresponds to the distance between the gold str ipes of the sample and their width of 5 μm at an FWHM of the lens instrum ental function of 15 μm)\, while it was theoretically possible\, on the " SR micro-XRF" installation with the available intensities of fluorescent s ignals and noise levels. A quantitative analysis of the reasons for this i s discussed in this work and illustrated in detail in a number of model ca ses. At the same time\, in certain experimental mapping regimes\, the achi evable resolution can be increased 1.5-2 times (provided there are no sign ificant systematic errors in the calculations).\n\nThe results of the rese arch will help to plan subsequent mapping experiments (they showed that th e data of the mapping conducted earlier were ill-suited to processing beca use of non-optimal experimental regime\, which led to a substantial system atic error with the desired 3-fold resolution increase\, because of the ed ge effects and not too good signal-to-noise ratio).\n\nThis work was suppo rted by the RFBR Grants № 14-02-00631\, 16-32-00705. The work by D.S. So rokoletov was supported by a scholarship of the President of the Russian F ederation (SP-2761.2016.2).\n\nReferences\n\n[1] http://ssrc.inp.nsk.su/CK P/stations/passport/3/\n\n[2] Sorokoletov D.S.\, Rakshun Ya.V. "Some aspec ts of quantitative micro-XRF based on the use of polycapillary lenses" // Book of Abstracts. The International Joint School «Smart Nanomaterials an d X-Ray Optics 2015: Modeling\, Synthesis and diagnostics» for young rese archers. Rostov-on-Don\, 26-30\, September\, 2015. (ISBN 978-5-98615-164-9 )\n\n[3] Sorokoletov D.S.\, Rakshun Ya.V. "An Tikhonov regularizing method in micro-XRF inverse problem on example of the studying of a test sample - a fragment of an RF bipolar transistor chip (in Russian)" // Book of Ab stracts. The Young Scientist School «Applications of synchrotron and\nter ahertz radiation for studies of high energy materials». Biysk\, 15-20\, S eptember\, 2015.\n\n[4] Leonov A.S. Solving ill-posed inverse problems: es say on the theory\, practical algorithms\, and demonstrations in Matlab (i n Russian). Second edition. Moscow\, "Publishing House "Lybrokom"". 2013. 336 p.\n\nhttps://indico.inp.nsk.su/event/3/contributions/1284/ LOCATION:Budker INP 2nd and 3rd floors URL:https://indico.inp.nsk.su/event/3/contributions/1284/ END:VEVENT END:VCALENDAR