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SUMMARY:Performance and characterisation of CsI:Tl thin films for X-ray im
 aging application
DTSTART;VALUE=DATE-TIME:20160707T094000Z
DTEND;VALUE=DATE-TIME:20160707T100000Z
DTSTAMP;VALUE=DATE-TIME:20260520T034520Z
UID:indico-contribution-1317@indico.inp.nsk.su
DESCRIPTION:Speakers: evgeny kozyrev (binp)\nWe developed method of thin s
 cintillator films preparation based on thermal CsI(Tl) deposition on glass
  substrates. The influence of deposition conditions on the micro columnar 
 structure and crystalline property of the films was studied by scattering 
 electron microscopy. The element composition was investigated by X-ray flu
 orescence method. We measured light output and spacial resolution as a fun
 ction of input photons energy (5-35 keV) and film thickness (2-20 mkm). It
  was observed the strong anti-correlations between the time of CsI(Tl) dep
 osition\, film light output and thallium concentration. The films can be u
 sed for charged particles beams monitoring as well as for X-ray imaging ap
 plications including micro tomography and topography.\n\nhttps://indico.in
 p.nsk.su/event/3/contributions/1317/
LOCATION:Budker INP Conference Hall
URL:https://indico.inp.nsk.su/event/3/contributions/1317/
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