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Description
Ultrafast electron beams lengthening and time jitter severely degrade the temporal resolution in electron-laser applications, such as ultrafast electron diffraction (UED). In recent years, terahertz-driven devices have shown great potential in beam manipulation and diagnostics. This paper reports an all-optical method for compressing and characterizing a 3 MeV electron beam using single-cycle terahertz radiation. A THz buncher longitudinally compresses the electron beams, and the resulting shortest bunch length and arrival time are measured using a transverse THz field in a downstream terahertz slit. Particle tracking simulation shows that the bunch is compressed more than 13 times from 54 fs to 4 fs, and the arrival time jitter is reduced from 100 fs to 21 fs. This method effectively manipulates the beam longitudinal phase space, compresses the beam length, and suppresses the time jitter. It is expected to significantly impact ultrafast science and be applied in other accelerator applications.
Young scientist paper | Yes |
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