XAFS spectra were measured near the K edges of the absorption of phosphorus, sulfur, and L III absorption edges of molybdenum and niobium (2100 - 2700 eV). The measurements were carried out using an upgraded Si (111) dual-crystal monochromator in normal incidence geometry. The monochromator device is described. The main difficulties arising in the course of obtaining spectra are discussed. It is shown that the spectral resolution of the monochromator allows one to obtain XAFS spectra, the quality of which is sufficient to decipher the structure of the sample. The measurement was carried out with a partial funding from the Russian Science Foundation (project No. 18-03-01061).