X-ray diffractometers and spectrometers Bruker AXS for materials research

13 Jul 2020, 18:50
Zoom 860 5034 1820 (Zoom)

Zoom 860 5034 1820



Mr Alexandr Shevchukov (Melytec LLC)


Bruker AXS x-ray diffraction and scattering portfolio enables detailed analysis of any material from fundamental research to industrial quality control providing forward looking solutions to customers today. Applications of these qualitative and quantitative techniques include: phase identification, quantitative analysis, crystal structure determination, pdf analysis (total scattering), small angle x-ray scattering, x-ray reflectometry, high resolution x-ray diffraction, reciprocal space mapping, residual stress, texture. XRF spectrometers Bruker AXS combines highest accuracy and precision with simple and fast sample preparation for the analysis of elements from Beryllium (Be) to Uranium (U) in the concentration range from 100 % down to the sub-ppm-level.

Primary authors

Mr Alexandr Shevchukov (Melytec LLC) Mr Mark Zheleznyi (Melytec LLC)

Presentation Materials