Carrier dynamics in doped Ge measured at the free electron laser facility FELBE

6 Jul 2016, 14:00
20m
Parallel session Hall (Budker INP)

Parallel session Hall

Budker INP

Oral THz radiation aplication FEL-based study and THz radiation application

Speaker

Mr Nils Dessmann (Humboldt-University Berlin)

Description

Cooled germanium (Ge) photoconductive detectors are one of the most sensitive detectors at terahertz (THz) frequencies. They are widely used in laboratory spectroscopy and imaging experiments. The speed of a Ge photoconductive detector is set by technical limitations such as the bias circuit, the geometry of the detector crystal and the electric field applied to the .detector. The recovery speed of the detector material is, however, fundamentally limited only by the lifetimes of the intraband relaxation of the free charge carriers within the valence or conduction band and by band-to-impurity relaxation (capture) down to the impurity ground state. Therefore, capture and intraband relaxation processes have been measured for different dopants in uncompensated and compensated n- and p-type Ge by a pump-probe technique at the free electron laser facility FELBE.

Primary author

Mr Nils Dessmann (Humboldt-University Berlin)

Co-authors

Mr Andreas Pohl (Humboldt-Universität zu Berlin) Dr D. V. Shengurov (IPM-RAS) Prof. Heinz-Wilhelm Hübers (German Aerospace Center (DLR) and Humboldt University Berlin) Dr Nikolay Abrosimov (Leibniz Institute for Crystal Growth) Dr Roman Zhukavin (IPM-RAS) Dr Sergey Pavlov (German Aerospace Center) Prof. Valery Shastin (IPM-RAS) Dr Veniamin Tsyplenkov (IPM-RAS) Dr Winnerl Stephan (HZDR)

Presentation Materials