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Description
Ion sources often generate beams in which, in addition to the working type of ions, there is a spectrum of parasitic charged particles that mask the main current and make it difficult to correctly measure the source parameters. The article describes a technique for measuring the characteristics of a working-type ion beam by separating it from a full beam from a source from the measurements results by the pepper-pot method. The article describes an ECR ion source and a measuring device, a technique for identifying and separating spots of various types of ions from a scintillator image, calculating their characteristics, a method for identifying a helium ion beam, and presents the results of measuring the characteristics of a helium ion beam at the source output.
| Young scientist paper | No |
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