Conceptual design of synchrotron beamline combined Photoelectron, Emission and Absorption Spectroscopies and Reflectometry for studying Electronic Structure in soft and tender x-ray range

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Conference Hall (Budker INP)

Conference Hall

Budker INP

Lavrentiev av. 11, Novosibirsk 630090 Russia
Poster SR technological application and X-ray apparatus


Dr Tatyana Asanova (Institute of Inorganic Chemistry)


An undulator beamline with working name “Electronic structure” at the new synchrotron center SKIF (Novosibirsk, Russia) will be dedicated to advanced X-ray spectroscopies for studying electronic structure of the surface layers and in the bulk of different classes of compounds and functionalized materials with a high energy resolution in the x-ray range from 50 to 10000 eV. The beamline will consist of three beam stations. The first beam station will be based on X-ray Photoelectron Spectrometer making use such techniques as angle-resolved X-ray Photoelectron Spectroscopy (AR-XPS), HArd X-ray PhotoElectron Spectroscopy (HAXPES) and X-ray absorption near edge structure(XANES) under different conditions. The AR-XPS station will provide information about band structure, element composition, chemical states and local geometry of each elements which are present in the sample under study. Thanks to non-destructive HAXPES, one is indispensable in characterization of bulk materials, buried interfaces of multi-layered functional materials or as-grown samples. The second beam station will be based on a crystal spectrometer intended for x-ray emission spectroscopy (XES), which is also used for Resonant Inelastic X-ray scattering (RIXS), High Energy Resolution Fluorescent detected XANES or partially fluorescent yield(PFY) XANES. By combining the tunable incident energy with an x-ray emission spectrometer, resonance effects can be used for providing detailed information on the bulk electronic structure: studying spin-orbital interaction between electrons, configuration of electronic orbitals participating in chemical bonds as well as local structure of the probed element. The third beam station named as X-ray Reflectometry is dedicated to determine the optical properties of samples in transmission or reflection. The work will present a conceptual design of Electronic Structure Beamline and advanced application fields.

Primary author

Dr Tatyana Asanova (Institute of Inorganic Chemistry)


Dr Anton Nikolenko (BINP) Dr Igor Asanov (Nikolaev Institute of Inorganic Chemistry)

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