“Electronic Structure” is a state-of-the-art beamline for methods using the Soft X-Rays range (10-2000 eV) at the 3 GeV ring of SKIF synchrotron facility. At present, three branch lines is funded, which will host an end station for Near Ambient pressure X-Ray Photoelectron Spectroscopy (NAP XPS), Spin-Angle Resolved Photo-Emission Spectroscopy (Spin-ARPES) and Reflectometry and Metrology. The NAP XPS end station will allow carrying out in situ and operando studies of the composition and electronic structure of the active component for a wide range of catalytic systems at elevated pressure; in situ studies of regularities of deactivation/poisoning processes for catalytic systems depending on different conditions (composition of the reaction mixture, temperature, the presence of toxic agents, etc.); also in situ study of innovative functional materials. Another important technique which will be realized on a beam line (the other branch line) is Spin-Angle Resolved Photo-Emission Spectroscopy (Spin-ARPES) end station will allows to study the electronic and spin structure of solids for applications in nanoelectronics and spintronics. The third end station is Reflectometry and Metrology (the third branch line) end station will be used for certification of spectral optical elements, focusing elements and X-ray detectors; a reference detector method for absolute calibration of the spectral sensitivity of various kinds of X-ray radiation receivers in the VUV and Soft X-Rays ranges; a set of metrological techniques for calibrating the main characteristics of various kinds of X-ray detectors.